SK-732
Breakdown oxide layer and electrical diode tester
SPCIFICATION
Test item |
Reading |
Output item |
Test condition | Remark | ||||||
Unit | Range | Accuracy | Reproducibility | Unit | Range | Accuracy | Output time | |||
VF1 | V | 0.001~4.000 | ±0.5%±0.002 | ±0.002 | IF1 | A | 0.0001~0.0099 | ±0.5%+0.0002 | 0.3~9.9ms | |
0.0100~0.0400 | ±0.5%+0.0002 | 0.3~9.9ms | ||||||||
0.041~0.400 | ±0.5%+0.002 | 0.3~9.9ms | ||||||||
0.401~4.000 | ±0.5%+0.002 | 0.3~9.9ms | ||||||||
4.001~25.00 | ±0.5%+0.02 | 0.3~9.9ms | 註1 | |||||||
VZ1 | V | 1.000~16.000 | ±0.5%+0.002 | ±0.002 | IZ1 | mA | .0050~.1000 | ±0.5%+0.0002 | 1~200ms | MAX 2000V |
16.01~160.00 | ±0.5%+0.02 | ±0.02 | 0.101~1.000 | ±0.5%+0.002 | 1~200ms | MAX 2000V | ||||
160.1~400.0 | ±0.5%+0.2 | ±0.2 | 1.01~10.00 | ±0.5%+0.02 | 1~200ms | MAX 400V | ||||
401~2000 | ±0.5%+2 | ±2 | 10.1~100 | ±0.5%+0.2 | 1~200ms | MAX 80V | ||||
VZ2 | V | 1.000~16.000 | ±0.5%+0.002 | ±0.002 | IZ2 | mA | .0050~.1000 | ±0.5%+0.0002 | 1~200ms | MAX 2000V |
16.01~160.00 | ±0.5%+0.02 | ±0.02 | 0.101~1.000 | ±0.5%+0.002 | 1~200ms | MAX 2000V | ||||
160.1~400.0 | ±0.5%+0.2 | ±0.2 | 1.01~10.00 | ±0.5%+0.02 | 1~200ms | MAX 400V | ||||
401~2000 | ±0.5%+2 | ±2 | 10.1~100 | ±0.5%+0.2 | 1~200ms | MAX 80V | ||||
VZ3 | V | 1.000~16.000 | ±0.5%+0.002 | ±0.002 | IZ3 | mA | .0050~.1000 | ±0.5%+0.0002 | 1~200ms | MAX 2000V |
16.01~160.00 | ±0.5%+0.02 | ±0.02 | 0.101~1.000 | ±0.5%+0.002 | 1~200ms | MAX 2000V | ||||
160.1~400.0 | ±0.5%+0.2 | ±0.2 | 1.01~10.00 | ±0.5%+0.02 | 1~200ms | MAX 400V | ||||
401~2000 | ±0.5%+2 | ±2 | 10.1~100 | ±0.5%+0.2 | 1~200ms | MAX 80V | ||||
DVZ | DVZ = / VZ2 - VZ1 / | |||||||||
IR | uA | .0010~.9900 | ±3%+0.0002 | VR = %VZ1 | 1% ~ 99% | 10~200ms | ||||
0.990~9.900 | ±3%+0.002 | |||||||||
9.90~99.00 | ±3%+0.02 | |||||||||
99.0~990.0 | ±3%+0.2 | |||||||||
990~9900 | ±3%+2 | |||||||||
IR1 | uA | .0010~.9900 | ±3%+0.0002 | VR1 | V | 1.000~16.000 | ±0.5%+0.002 | 10~200ms | ||
0.990~9.900 | ±3%+0.002 | 16.01~160.00 | ±0.5%+0.02 | 10~200ms | ||||||
9.90~99.00 | ±3%+0.02 | 160.1~400.0 | ±0.5%+0.2 | 10~200ms | ||||||
99.0~990.0 | ±3%+0.2 | 401~2000 | ±0.5%+2 | 10~200ms | ||||||
990~9900 | ±3%+2 | |||||||||
IR2 | uA | .0010~.9900 | ±3%+0.0002 | VR2 | V | 1.000~16.000 | ±0.5%+0.002 | 10~200ms | ||
0.990~9.900 | ±3%+0.002 | 16.01~160.00 | ±0.5%+0.02 | 10~200ms | ||||||
9.90~99.00 | ±3%+0.02 | 160.1~400.0 | ±0.5%+0.2 | 10~200ms | ||||||
99.0~990.0 | ±3%+0.2 | 401~2000 | ±0.5%+2 | 10~200ms | ||||||
990~9900 | ±3%+2 | |||||||||
DIR | DIR = / IR1 - IR2 / |
- 1.When IF1 is higher than 10A, max output time is 1mS.
- 2.Unidirectin and Bidirection Capability
- 3.RS-232 Output Capability
- 4.Self Diagnostic Function
- 5.Power: AC 110V/220V SELECTED
- 6. It can set initialized, stopped and stepped IZ current through communication aommand. It can generate VZ curve by tansmitting each VZ reading to PC.